ESR dating of optically-bleached quartz grains: Evaluating measurement repeatability and reproducibility
- Duval, M.
- Guilarte, V.
- Bartz, M.
- Alonso Escarza, M.J.
- Ben Arous, E.
- del Val, M.
- García Rodríguez, C.
Revue:
Radiation Physics and Chemistry
ISSN: 1879-0895, 0969-806X
Année de publication: 2024
Volumen: 215
Type: Article